July 17, 2019 15:56

Abstract

Speaker: Dr. Devis Tuia, Ph.D., is a Professor at the Laboratory of Geo-Information Science and Remote Sensing, Wageningen University, the Netherlands

Title: Remote Sensing Data Science: beyond classifying pixels

Abstract: Remote sensing has bloomed in the last years, thanks to the increased availability of open data and the cross fertilisation with AI and machine learning. As a matter of fact, problems of detection and land classification can be handled effectively with data from multiple sources and powerful algorithms, often based on deep learning. The burning question is to understand if there is still room for moving beyond these traditional problems and tackling new problems with remote sensing technology. In this talk, I will present some new research perspectives on the understanding of high level concepts as landscape beauty and perception, as well as on visual dialogues. All seen through the lens of remote sensing imaging, of course.

Short bio: Devis Tuia received a Ph.D. in Environmental Sciences at University of Lausanne in 2009. He was then a postdoc researcher at the University of Valèencia, Spain, the University of Colorado, Boulder, CO, USA and EPFL Lausanne. In 2014-2017, he was an Assistant Professor at the University of Zurich. He is now a full professor at Wageningen University, the Netherlands. His research focuses on information extraction and data fusion of geospatial data (including remote sensing images) using machine learning algorithms. Visit http://devis.tuia.googlepages.com/ for more information.

More Information

Date July 26, 2019 (Fri) 11:00 - 12:00
URL https://c5dc59ed978213830355fc8978.doorkeeper.jp/events/94832

Venue

〒103-0027 Nihonbashi 1-chome Mitsui Building, 15th floor, 1-4-1 Nihonbashi,Chuo-ku, Tokyo